DocumentCode
2518589
Title
DEFORMABLE REGISTRATION OF DTI AND SPGR IMAGES
Author
Li, Hai ; Liu, Tianming ; Guo, Lei ; Wong, Stephen TC
Author_Institution
Sch. of Autom., Northwestern Polytech. Univ., Xi´´an
fYear
2007
fDate
12-15 April 2007
Firstpage
29
Lastpage
32
Abstract
Registration of DTI data with structure data, such as SPGR data, has import application in quantitative analysis of brain microstructures such as tissue diffusivity. However, due to potential problems such as EPI geometric distortion, partial volume effect and image reslicing errors, accurate registration of these two types of MRI images is challenging. In this paper, we present a novel deformable registration approach for DTI data and SPGR data. The registration approach includes two steps: (1) brain tissue segmentation based on seven-channel fusion of DTI data in order to obtain a complete tissue segmentation map of CSF, GM, and WM in the DTI space; and (2) hybrid volumetric and surface registration of DTI and SPGR data with the tissue segmentation maps in both DTI space and SPGR space. Experimental results are provided to demonstrate the performance of our approach
Keywords
biodiffusion; biological tissues; biomechanics; biomedical MRI; brain; deformation; image registration; image segmentation; medical image processing; neurophysiology; DTI images; EPI geometric distortion; MRI images; SPGR images; brain microstructures; brain tissue segmentation; deformable registration; diffusion tensor imaging; echo-planar imaging; hybrid volumetric registration; image registration; image reslicing errors; partial volume effect; seven-channel fusion; spoiled gradient-recalled echo imaging; surface registration; tissue diffusivity; tissue segmentation map; Anisotropic magnetoresistance; Automation; Bioinformatics; Biomedical imaging; Brain; Diffusion tensor imaging; Hidden Markov models; Image segmentation; Molecular imaging; Virtual reality;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2007. ISBI 2007. 4th IEEE International Symposium on
Conference_Location
Arlington, VA
Print_ISBN
1-4244-0672-2
Electronic_ISBN
1-4244-0672-2
Type
conf
DOI
10.1109/ISBI.2007.356780
Filename
4193214
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