Extension of digital test system data rates to the gigabit per second range

Author

Wenzel, Robert J. ; Keezer, David C.

Author_Institution

Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA

fYear

1993

fDate

18-20 May 1993

Firstpage

333

Lastpage

336

Abstract

A high frequency system and methodology are presented for the generation and capture of gigabit per second digital data. The approach extends the useful data rate of existing test systems by multiplexing channels, thereby allowing a trade-off between data rate and signal count. This capability facilitates the test of advanced bipolar emitter-coupled-logic (ECL) and GaAs digital devices using commercially available instrumentation. As an example, a GaAs-based data rate extender module is introduced which provides an interface between Gbps-range devices and a 200 Mbps host test system

Keywords

III-V semiconductors; automatic test equipment; bipolar logic circuits; calibration; digital instrumentation; emitter-coupled logic; gallium arsenide; logic testing; microcomputer applications; multiplexing equipment; semiconductor device testing; 200 Mbit/s; GaAs digital devices; bipolar emitter-coupled-logic; digital test system data rates; high frequency system; multiplexing channels; Circuit testing; Clocks; Electronics packaging; Flip-flops; Gallium arsenide; Microelectronics; Multiplexing; Switches; System testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE

Conference_Location

Irvine, CA

Print_ISBN

0-7803-1229-5

Type

conf

DOI

10.1109/IMTC.1993.382625

Filename

382625