• DocumentCode
    2519655
  • Title

    Infinity-norm sphere-decoding

  • Author

    Seethaler, Dominik ; Bolcskei, Helmut

  • Author_Institution
    Commun. Technol. Lab., ETH Zurich, Zurich
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    2002
  • Lastpage
    2006
  • Abstract
    The most promising approaches for efficient detection in multiple-input multiple-output (MIMO) wireless systems are based on sphere-decoding (SD). The conventional (and optimum) norm that is used to conduct the tree traversal step in SD is the l2-norm. It was, however, recently shown that using the linfin-norm instead significantly reduces the VLSI implementation complexity of SD at only a marginal performance loss. These savings are due to a reduction in the length of the critical path and the silicon area of the circuit, but also, as observed previously through simulation results, a consequence of a reduction in the computational (algorithmic) complexity. The aim of this paper is an analytical performance and computational complexity analysis of linfin-norm SD. For i.i.d. Rayleigh fading MIMO channels, we show that linfin-norm SD achieves full diversity order with an asymptotic SNR gap, compared to l2-norm SD, that increases at most linearly in the number of receive antennas. Moreover, we provide a closed-form expression for the computational complexity of linfin-norm SD.
  • Keywords
    MIMO communication; Rayleigh channels; channel coding; computational complexity; decoding; diversity reception; tree searching; Rayleigh fading MIMO channel; closed-form expression; computational complexity; infinity-norm sphere-decoding; linfin-norm sphere-decoding; multiple input multiple output wireless system; tree traversal; Circuit simulation; Computational complexity; Computational modeling; H infinity control; MIMO; Performance analysis; Performance loss; Rayleigh channels; Silicon; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595340
  • Filename
    4595340