DocumentCode
2519719
Title
Individual characterization of broadband sampling oscilloscopes with a `nose-to-nose´ calibration procedure
Author
Verspecht, Jan ; Rush, Ken
fYear
1993
fDate
18-20 May 1993
Firstpage
203
Lastpage
208
Abstract
A method is proposed to find the individual impulse response of broadband sampling oscilloscopes. The method is based on the fact that, when the oscilloscope is sampling a DC voltage, pulses are launched from the sampler toward the input connector. These pulses contain information on the scope characteristics. They can be measured by a second oscilloscope. This type of measurement is called a nose-to-nose calibration. By applying deconvolution techniques to the results of this measurement, the characteristics of the two scopes can be found, supposing that the two scopes are identical. To avoid this assumption, three oscilloscopes can be used. The nose-to-nose is then applied three times. Each time a different pair of scopes is connected together. The individual characteristics of the three sampling oscilloscopes are then calculated. Both SPICE simulations and close correspondence between swept sine measurements and this method indicate that it is probably the most accurate method available at this moment to calibrate broadband sampling oscilloscopes. Several measurement uncertainties and practical problems are identified
Keywords
SPICE; automatic test equipment; automatic testing; calibration; deconvolution; electronic equipment testing; measurement errors; oscilloscopes; signal processing equipment; DC voltage; SPICE simulations; broadband sampling oscilloscopes; deconvolution; impulse response; measurement uncertainties; nose-to-nose calibration; scope characteristics; swept sine measurements; Bandwidth; Calibration; Circuits; Connectors; Deconvolution; Measurement uncertainty; Oscilloscopes; Pulse shaping methods; SPICE; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location
Irvine, CA
Print_ISBN
0-7803-1229-5
Type
conf
DOI
10.1109/IMTC.1993.382651
Filename
382651
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