• DocumentCode
    2519755
  • Title

    Equivalent reactance model on shielding effectiveness analysis of high-transparent ring metallic mesh with submillimeter period and micrometer linewidth

  • Author

    Lu Zhengang ; Zhigang, Fan ; Jin Peng ; Tan Jiubin

  • Author_Institution
    Postdoctoral Res. Station of Opt. Eng., Harbin Inst. of Technol., Harbin, China
  • fYear
    2010
  • fDate
    3-6 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In order to accurately and efficiently analyze the shielding effectiveness of high-transparent ring metallic mesh with submillimeter period and micrometer linewidth, an equivalent reactance model for the ring metallic mesh is proposed by using the equivalent reactance of its external and internal square meshes as well as two proportional factors. A ring metallic mesh sample was fabricated by UV-lithography and its shielding effectiveness was measured at 0° and 30° incident S-polarization microwaves. Experimental results agree well with simulated results, which proves the correctness of the equivalent reactance model proposed. So the equivalent reactance model can be used in the calculation and analysis of shielding effectiveness of high-transparent ring metallic mesh.
  • Keywords
    electric reactance; electromagnetic shielding; metals; ultraviolet lithography; S-polarization microwaves; UV lithography; equivalent reactance model; high-transparent ring metallic mesh; micrometer linewidth; shielding effectiveness analysis; submillimeter period; Analytical models; Equivalent circuits; Microwave filters; Microwave measurements; Optical device fabrication; Optical diffraction; Optical filters; UV-lithography; electromagnetic shielding effectiveness; equivalent reactance; ring metallic mesh;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4244-8393-8
  • Electronic_ISBN
    978-1-4244-8392-1
  • Type

    conf

  • DOI
    10.1109/AOM.2010.5713595
  • Filename
    5713595