Statistical analysis for the oscillation frequency of a ring oscillator

Author

Zhu, Wanjing ; Lu, Tan ; Zhu, Weijie ; Ma, Jianguo

Author_Institution

Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

fYear

2010

fDate

15-17 Dec. 2010

Firstpage

1

Lastpage

4

Abstract

It is important to find the statistical characteristics of the ring oscillators in mass production but the computational complexity prevents us from finding the distribution of these characteristics. Consequently, predicting the statistical parameters of these characteristics is much more practical. This paper derives the mathematical relationship between the variation of the capacitances and the process variations. And the Monte Carlo Method is used to build three linear prediction equations for the variation of oscillation frequency.

Keywords

Monte Carlo methods; capacitance; computational complexity; mass production; oscillators; statistical analysis; Monte Carlo method; capacitances; computational complexity; linear prediction equations; mass production; oscillation frequency; process variations; ring oscillator; statistical analysis; statistical characteristics; statistical parameters; Capacitance; Logic gates; Monte-Carlo Method; Process Variation; Ring Oscillator; Statistical Analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of

Conference_Location

Hong Kong

Print_ISBN

978-1-4244-9997-7

Type

conf

DOI

10.1109/EDSSC.2010.5713684

Filename

5713684