DocumentCode
2521042
Title
On The Total Dose Radiation Hardness Of Floating Gate EEPROM Cells
Author
Wellekens, D. ; Groeseneken, G. ; Van Houdt, J. ; Maes, H.E.
Author_Institution
IMEC
fYear
1993
fDate
22-24 Jun 1993
Firstpage
74
Lastpage
77
Keywords
Charge measurement; Charge pumps; Current measurement; Density measurement; EPROM; Geometry; Guidelines; Nonvolatile memory; Research and development; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nonvolatile Memory Technology Review, 1993
Print_ISBN
0-7803-1290-2
Type
conf
DOI
10.1109/NVMT.1993.696956
Filename
696956
Link To Document