DocumentCode
2524462
Title
When “almost” is good enough: a fresh look at DSP clock rates
Author
Rosenfeld, Eric ; Max, Solomon
Author_Institution
LTX Corp., Westwood, MA, USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
249
Lastpage
253
Abstract
Traditional DSP mixed-signal coherent test techniques require precise frequency ratios. This paper explores the limits of this requirement to define how closely rates must match ideal ratios to obtain proper results. Both worst-case and typical situations are considered. Worst-case conditions allow errors on the order of one part in 200,000,000,000. While small, this error tolerance allows changes in tester architecture that can simplify the design of DSP test programs
Keywords
clocks; digital signal processing chips; failure analysis; fault tolerant computing; integrated circuit testing; mixed analogue-digital integrated circuits; DSP clock rates; DSP test; error tolerance; mixed-signal coherent test; tester architecture; Circuit testing; Clocks; Design engineering; Digital signal processing; Equations; Frequency conversion; Hardware; Instruments; Measurement techniques; Signal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743159
Filename
743159
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