ATPG in practical and non-traditional applications

Author

Keller, Brion ; McCauley, Kevin ; Swenton, Joseph ; Youngs, James

Author_Institution

IBM Corp., Endicott, NY, USA

fYear

1998

fDate

18-23 Oct 1998

Firstpage

632

Lastpage

640

Abstract

There exist many different problems in the design automation realm that have no simple solution. Often a problem requires some kind of search through a potential solution space to see if one or more examples exist to prove or disprove a supposition. In many of these cases it is possible to use an ATPG engine to perform an examination of the search space. This paper describes many of the various applications of ATPG used within IBM over the past few decades, along with some indication as to the perceived benefits

Keywords

VLSI; asynchronous circuits; automatic test pattern generation; circuit CAD; design for testability; fault diagnosis; integrated circuit design; logic CAD; logic testing; ATPG engine; IBM; IC design; asynchronous feedback loop; design automation; interactive circuit analysis; logic design; logic testing; redundancy; Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Design automation; Design for testability; Logic testing; Pins; Redundancy; Search engines;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743207

Filename

743207

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2525538