• DocumentCode
    2526900
  • Title

    Measuring and fitting of the small signal model of the MOS transistor for high frequency applications

  • Author

    Vandeloo, P. ; Sansen, W.

  • Author_Institution
    Katholieke Univ., Leuven, Belgium
  • fYear
    1988
  • fDate
    20-22 Apr 1988
  • Firstpage
    232
  • Lastpage
    237
  • Abstract
    A small-signal model of a MOS transistor, valid at frequencies around the unity gain frequency, fT, is presented. As opposed to earlier models, it takes into account the non-quasi-static and transmission-line effects of the transistor. By using computer-controlled calibration of the test setup and network analyzer, mathematical transformations, and fit routines, all the AC parameters can be calculated from the measured S-parameters. The design of high-frequency conductance amplifiers shows that the model and measurement method are accurate at frequencies up to 3FT
  • Keywords
    calibration; computerised instrumentation; computerised signal processing; curve fitting; high-frequency amplifiers; insulated gate field effect transistors; network analysers; semiconductor device models; AC parameters; MOS transistor; S-parameters; computer-controlled calibration; computerised instrumentation; fit routines; fitting; high frequency applications; high-frequency conductance amplifiers; insulated gate FET; mathematical transformations; network analyzer; semiconductor device models; small signal model; transmission-line effects; unity gain frequency; Bandwidth; Capacitance; Circuits; Doping; Equations; Frequency conversion; Frequency measurement; MOSFETs; Transmission line measurements; Transmission line theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/IMTC.1988.10857
  • Filename
    10857