• DocumentCode
    2526997
  • Title

    Defect level prediction for IDDQ testing

  • Author

    Okuda, Yukio ; Kubota, Isao ; Watanabe, Masahiro

  • Author_Institution
    Dept. of Design Autom., Sony Corp., Atsugi, Japan
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    900
  • Lastpage
    909
  • Abstract
    A problem with IDDQ testing is its inability to predict defect level. This paper classifies defects detected by IDDQ testing into two categories: those that can be modeled by stuck-at-fault (SAF) model and those that can not be modeled by SAF, based on statistical analysis of production failures and field failures. A new approach for curve fitting to a classical model is presented. The effect of a pass/fail limit on test quality is discussed
  • Keywords
    CMOS integrated circuits; automatic testing; curve fitting; fault diagnosis; integrated circuit reliability; integrated circuit testing; production testing; statistical analysis; IDDQ testing; curve fitting; defect level prediction; field failures; pass/fail limit; production failures; statistical analysis; stuck-at-fault model; test quality; Automatic testing; Curve fitting; Design automation; Failure analysis; Fault diagnosis; Helium; Manufacturing; Predictive models; Production; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743281
  • Filename
    743281
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2526997