DocumentCode
2527056
Title
On-line testing of scalable signal processing architectures using a software test method
Author
Aktouf, C. ; Al-Hayek, G. ; Robach, C.
Author_Institution
LCIS-ESISAR, Valence, France
fYear
1998
fDate
18-23 Oct 1998
Firstpage
926
Lastpage
933
Abstract
This paper presents a unified approach which allows efficient concurrent tests to be considered when synthesizing scalable signal processing multiprocessor architectures. The approach is based on two earlier works. The first work has allowed the synthesis of scalable multiprocessor architectures where comparison testing is considered. The second work has shown the feasibility of using a software technique called mutation testing to successfully test hardware devices. The presented approach ensures that VLSI digital signal processors (DSP) are totally tested concurrently within useful computation. Based on realistic examples of signal processing applications and state-of-the-art DSPs, the approach is shown to be highly efficient in terms of fault coverage and fault latency
Keywords
VLSI; automatic testing; concurrent engineering; digital signal processing chips; fault diagnosis; integrated circuit reliability; integrated circuit testing; logic testing; multiprocessing systems; VLSI; comparison testing; concurrent tests; fault coverage; fault latency; multiprocessor architectures; mutation testing; scalable signal processing architectures; signal processing applications; software test method; Computer architecture; Concurrent computing; Digital signal processing; Digital signal processors; Genetic mutations; Hardware; Signal processing; Signal synthesis; Software testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743285
Filename
743285
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