DocumentCode
2527097
Title
An automatic measuring device based on PC for MOVs´ aging test
Author
Yanyong, Li ; Shengtao, Li ; Lei, Li ; Fuyi, Liu
Author_Institution
State Key Lab. of Electr. Insulation for Power Equipment, Xi´´an Jiaotong Univ., China
Volume
2
fYear
2000
fDate
2000
Firstpage
1026
Abstract
A new kind of system based on a PC for the metal oxide varistor (MOV) aging test has been developed, which can detect and analyze the leakage current signal with the aid of the computer. The principle of the system is presented in brief
Keywords
ageing; automatic test equipment; electric current measurement; leakage currents; loss measurement; microcomputer applications; semiconductor device testing; varistors; PC based test; automatic measuring device; leakage current signal detection; metal oxide varistor aging test; power loss; Aging; Automatic testing; Current measurement; Leakage current; Power harmonic filters; Power measurement; Power system harmonics; Resistors; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location
Xi´an
Print_ISBN
0-7803-5459-1
Type
conf
DOI
10.1109/ICPADM.2000.876407
Filename
876407
Link To Document