• DocumentCode
    2527229
  • Title

    Contact Material for Vacuum Interrupters based on CuCr with a Specific High Short Circuit Interruption Ability

  • Author

    Gentsch, D.

  • Author_Institution
    ABB AG, Ratingen
  • Volume
    2
  • fYear
    2006
  • fDate
    25-29 Sept. 2006
  • Firstpage
    437
  • Lastpage
    442
  • Abstract
    Vacuum interrupters (VI) with specific high short circuit interruption ability are mostly equipped with the well known contact material based on copper and chromium. A review of different production techniques as well as behaviour and microstructure of commercially available materials is presented with emphasis on two of the predominantly applied methods. The contact material´s switching performance strongly depends on it´s mechanical properties, gas and element concentration evaluated for each batch of base material. The contacts microstructure is investigated using scanning electron microscopy (SEM) and energy dispersive X-ray (EDX). Switching performance is proven on standard Vis and the examination is held in a high performance lab by interrupting a sequence with a huge number of short circuit currents in accordance to the standards according IEC 62271-100. When conducting limitation tests at higher demands than required a ranking of material batches is presented. The study is based on standard contact material with a chromium content of 25 wt.% used on the transverse magnetic field (TMF) contact system. Derived from the results a very compact VI for a rating of 40.5 kV at 40 kA with increased specific performance is introduced
  • Keywords
    IEC standards; X-ray chemical analysis; chromium alloys; composite materials; copper alloys; crystal microstructure; electrical contacts; scanning electron microscopy; vacuum interrupters; 40 kA; 40.5 kV; CuCr; EDX; IEC 62271-100 standard; SEM; commercially available materials; contact material; contacts microstructure; element concentration; energy dispersive X-ray; gas concentration; limitation tests; material batches ranking; material behaviour; material microstructure; mechanical properties; production techniques; scanning electron microscopy; specific high short circuit interruption ability; switching performance; transverse magnetic field contact system; vacuum interrupters; Chromium; Circuits; Conducting materials; Copper; IEC standards; Interrupters; Magnetic materials; Microstructure; Production; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
  • Conference_Location
    Matsue
  • ISSN
    1093-2941
  • Print_ISBN
    1-4244-0191-7
  • Type

    conf

  • DOI
    10.1109/DEIV.2006.357331
  • Filename
    4194912