• DocumentCode
    2527290
  • Title

    Synthetic Tests of Capacitive Current Switching Using a Test Vessel

  • Author

    Körner, Florian ; Lindmayer, Manfred ; Kurrat, Michael ; Gentsch, Dietmar

  • Author_Institution
    Inst. fur Hochspannungstechnik und Elektrische Energieanlagen, Technische Univ. Braunschweig
  • Volume
    2
  • fYear
    2006
  • fDate
    25-29 Sept. 2006
  • Firstpage
    451
  • Lastpage
    454
  • Abstract
    According to the relevant IEC standards vacuum circuit-breakers have to meet various needs, e.g. the interruption capability, making operations, and dielectric strength. Switching of capacitor banks, overhead lines, or cables leads to very small currents in comparison with short-circuit currents. After current interruption the circuit-breaker must withstand twice the peak value of the system voltage. Furthermore, restrikes can lead to voltage multiplication. The conjunction of relatively small breaking currents with high voltage stress must be considered in detail. This work introduces a test arrangement for combined tests of making operation, current interruption, and dielectric stress of a vacuum gap under capacitive switching condition. A test vessel permits investigations of various contact materials and designs. It is connected to a synthetic test circuit which provides the appropriate test currents and capacitive voltage. Both the appearance of pre-ignitions at contact closing and the behavior under capacitive voltage stress after breaking are observed as indications of the contact surface conditions
  • Keywords
    IEC standards; capacitor switching; ignition; machine testing; vacuum circuit breakers; IEC standards; capacitive current switching; capacitive switching; capacitive voltage stress; combined tests; contact materials; contact surface conditions; current interruption; dielectric strength; dielectric stress; high voltage stress; interruption capability; making operations; small breaking currents; synthetic tests; test arrangement; vacuum circuit-breakers; vacuum gap; voltage multiplication; Capacitors; Circuit testing; Contacts; Dielectric breakdown; Frequency; Stress; Surges; Switches; Switching circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
  • Conference_Location
    Matsue
  • ISSN
    1093-2941
  • Print_ISBN
    1-4244-0191-7
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2006.357334
  • Filename
    4194915