DocumentCode
2527483
Title
Estimation of frequency offset, cell ID and CP length in OFDMA mode of WMAN
Author
Pushpa, K. ; Kishore, Ch Nanda ; Yoganandam, Y.
Author_Institution
Malla Reddy Inst. of Tech & Sci., Secunderabad
fYear
2008
fDate
19-21 Nov. 2008
Firstpage
1
Lastpage
5
Abstract
Orthogonal Frequency Division Multiple Access (OFDMA) gains increasing attention for broadband, high data rate fixed/mobile communications. As the basic modulation technique in OFDMA is orthogonal frequency division multiplexing (OFDM), it is severely affected by carrier frequency offset (CFO). The CFO causes loss of orthogonality among the subcarriers. In this paper, we propose a method for joint estimation of CFO and cell ID. Cell ID represents the number of the preamble selected by the base station in the downlink. The proposed method is based on the preamble suggested for OFDMA mode of WMAN where the preamble is loaded on every third subcarrier. The proposed method is an extension of Schimdl and Coxpsilas method. We also propose a method for estimation of CP length. Van de Beekpsilas method is adapted for the estimation of CP length in OFDMA mode of WMAN. Simulations are conducted for AWGN and frequency selective channels to demonstrate the performance of the proposed methods.
Keywords
AWGN channels; WiMax; frequency division multiple access; frequency estimation; mobile radio; AWGN channels; CP length estimation; OFDMA mode; WMAN; base station; cell ID; data rate fixed/mobile communications; frequency offset estimation; frequency selective channels; orthogonal frequency division multiple access; Base stations; Bit error rate; Downlink; Frequency conversion; Frequency estimation; Frequency synchronization; Intersymbol interference; Mobile communication; OFDM modulation; Transmitters; BWA; CP length; OFDM; OFDMA; WMAN; cell ID; cyclic prefix; frequency offset estimation; frequency synchronization; preamble;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location
Hyderabad
Print_ISBN
978-1-4244-2408-5
Electronic_ISBN
978-1-4244-2409-2
Type
conf
DOI
10.1109/TENCON.2008.4766566
Filename
4766566
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