DocumentCode
252753
Title
Microfabrication of high aspect ratio microtube arrays to store high density charged particles
Author
Narimannezhad, Alireza ; Jennings, Joshah ; Weber, Marc H. ; Lynn, Kelvin G.
Author_Institution
Center for Mater. Res., Washington State Univ., Pullman, WA, USA
fYear
2014
fDate
13-16 April 2014
Firstpage
269
Lastpage
274
Abstract
Fabrication of a portable high-density charged particle trap with an array of micro-Penning-Malmberg traps (microtraps) with substantially lower end barrier potentials than conventional Penning-Malmberg traps is presented [1]. The microtraps are designed for antimatter storage such as positrons. The fabrication of large length to radius aspect ratio (1000:1) microtrap arrays involved advanced techniques including photolithography, deep reactive ion etching (DRIE) of silicon wafers to achieve through-vias, gold sputtering of the wafers surfaces and inside the vias, and thermal compression bonding. The bonded stacks were gold electroplated to achieve a uniform gold surface to minimize the patch effects. Positron losses occur in experimentation by trap imperfections such as misalignment of microtraps, asymmetries, and physical imperfections on the surfaces. This paper describes the fabrication issues encountered and addresses geometry errors and asymmetries.
Keywords
lithography; microfabrication; sputter etching; DRIE; antimatter storage; bonded stacks; deep reactive ion etching; geometry errors; gold sputtering; high aspect ratio microtube arrays; high density charged particle trap; microPenning-Malmberg traps; microfabrication; microtraps; patch effect; photolithography; silicon wafers; thermal compression bonding; trap imperfection; wafers surfaces; Adhesives; Etching; Gold; Resists; Silicon; Sputtering; Etching; Lithography; Positrons; Sputtering; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2014 9th IEEE International Conference on
Conference_Location
Waikiki Beach, HI
Type
conf
DOI
10.1109/NEMS.2014.6908806
Filename
6908806
Link To Document