• DocumentCode
    2529297
  • Title

    VLSI Test technology: Why is the field not sexy enough?

  • Author

    Hamdioui, Said ; Aitken, Rob

  • Author_Institution
    Tech. Univ. Delft, Delft, Netherlands
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Although it is an integral part of any manufactured chip and a crucial step to guarantee the required quality, VLSI Test technology seems to become less attractive/interesting for the research community. Funding bodies are minimizing their funding in the area, scientists are moving to other hot topics, industry is not seriously supporting academia in the field, etc.
  • Keywords
    VLSI; integrated circuit testing; VLSI test technology; manufactured chip; research community; Collaboration; Communities; Europe; Foundries; Industries; USA Councils; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233047
  • Filename
    6233047
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2529297