A sensitivity analysis of the spectral mismatch correction procedure using wavelength-dependent error sources [solar cell testing]

A detailed investigation has been completed concerning the influence of wavelength-dependent random and bias measurement errors on the spectral mismatch correction procedure associated with solar cell performance measurements and reference cell calibration. It is shown that common distributions for random and bias measurement errors can result in an overall uncertainty of over ±3% in short-circuit current using a solar simulator. This analysis has also identified a reference cell calibration procedure with one-half the uncertainty associated with the best outdoor calibration procedure