• DocumentCode
    2532267
  • Title

    Carbon nanotube-based membranes: a platform for studying nanofluidics

  • Author

    Holt, Jason K. ; Park, Hyung Gyu ; Noy, Aleksandr ; Huser, Thomas ; Eaglesham, David ; Bakajin, Olgica

  • Author_Institution
    Chem. & Mater. Sci. Directorate, Lawrence Livermore Nat. Lab., CA, USA
  • fYear
    2004
  • fDate
    16-19 Aug. 2004
  • Firstpage
    110
  • Lastpage
    112
  • Abstract
    A membrane of multiwalled carbon nanotubes embedded in a silicon nitride matrix was fabricated for use in studying fluid mechanics on the nanometer scale. Characterization by fluorescent tracer diffusion and scanning electron microscopy suggests that the membrane is void-free near the silicon substrate on which it rests, implying that the hollow core of the nanotube is the only conduction path for molecular transport. Nitrogen flow measurements of a nanoporous silicon nitride membrane, fabricated by sacrificial removal of carbon, give a flow rate of 0.086 cc/sec. Calculations of water flow across a nanotube membrane give a rate of 2.1×10-6 cc/sec (0.12 μL/min).
  • Keywords
    carbon nanotubes; channel flow; diffusion; electron beam deposition; flow through porous media; membranes; microfluidics; nanoporous materials; nanotechnology; nitrogen; scanning electron microscopy; silicon compounds; water; C-SiC; H2O; N2; Si; carbon removal rate; fluorescent tracer diffusion; hollow nanotube core; molecular transport; multiwalled carbon nanotube based membranes; nanofluidics; nanometer scale fluid mechanics; nanoporous silicon nitride membrane; nitrogen flow measurements; nitrogen flow rate; scanning electron microscopy; silicon nitride matrix; silicon substrate; void-free membrane; water flow; Biomembranes; Carbon nanotubes; Chemistry; Iron; Materials science and technology; Nanobioscience; Nanofluidics; Nanoporous materials; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2004. 4th IEEE Conference on
  • Print_ISBN
    0-7803-8536-5
  • Type

    conf

  • DOI
    10.1109/NANO.2004.1392266
  • Filename
    1392266