DocumentCode
2533609
Title
Delay Insensitivity Does Not Mean Slope Insensitivity!
Author
Ouchet, Florent ; Morin-Allory, Katell ; Fesquet, Laurent
Author_Institution
TIMA Lab., Grenoble INP, Grenoble, France
fYear
2010
fDate
3-6 May 2010
Firstpage
176
Lastpage
184
Abstract
Asynchronous circuits are well known for their intrinsic robustness to process, voltage and temperature variations. Nevertheless, in some extreme cases, it appears that their robustness is not sufficient to guarantee a correct circuit behavior. This limitation, which is caused by an analog phenomenon, appears when the transition slopes in input of C-elements become very slow. This paper describes in details this phenomenon and studies the robustness of different C-element topologies. The simulations, which have been performed in 130, 65 and 45 nm CMOS technologies, show an overview of the C-element behavior in presence of these slow ramps. This gives a comprehensive understanding of the phenomenon and suggests an appropriate approach for choosing the well-suited C-element topology for everybody facing these difficulties.
Keywords
CMOS integrated circuits; asynchronous circuits; circuit simulation; network topology; C-element topology; CMOS technology; asynchronous circuits; circuit behavior; delay insensitivity; intrinsic robustness; slope insensitivity; Aging; Asynchronous circuits; CMOS logic circuits; CMOS technology; Circuit simulation; Circuit topology; Delay systems; Laboratories; Robustness; Voltage; C-element; asynchronous logic; delay insensitivity; slope insensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Asynchronous Circuits and Systems (ASYNC), 2010 IEEE Symposium on
Conference_Location
Grenoble
ISSN
1522-8681
Print_ISBN
978-0-7695-4032-0
Electronic_ISBN
1522-8681
Type
conf
DOI
10.1109/ASYNC.2010.27
Filename
5476962
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