• DocumentCode
    2533609
  • Title

    Delay Insensitivity Does Not Mean Slope Insensitivity!

  • Author

    Ouchet, Florent ; Morin-Allory, Katell ; Fesquet, Laurent

  • Author_Institution
    TIMA Lab., Grenoble INP, Grenoble, France
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    176
  • Lastpage
    184
  • Abstract
    Asynchronous circuits are well known for their intrinsic robustness to process, voltage and temperature variations. Nevertheless, in some extreme cases, it appears that their robustness is not sufficient to guarantee a correct circuit behavior. This limitation, which is caused by an analog phenomenon, appears when the transition slopes in input of C-elements become very slow. This paper describes in details this phenomenon and studies the robustness of different C-element topologies. The simulations, which have been performed in 130, 65 and 45 nm CMOS technologies, show an overview of the C-element behavior in presence of these slow ramps. This gives a comprehensive understanding of the phenomenon and suggests an appropriate approach for choosing the well-suited C-element topology for everybody facing these difficulties.
  • Keywords
    CMOS integrated circuits; asynchronous circuits; circuit simulation; network topology; C-element topology; CMOS technology; asynchronous circuits; circuit behavior; delay insensitivity; intrinsic robustness; slope insensitivity; Aging; Asynchronous circuits; CMOS logic circuits; CMOS technology; Circuit simulation; Circuit topology; Delay systems; Laboratories; Robustness; Voltage; C-element; asynchronous logic; delay insensitivity; slope insensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asynchronous Circuits and Systems (ASYNC), 2010 IEEE Symposium on
  • Conference_Location
    Grenoble
  • ISSN
    1522-8681
  • Print_ISBN
    978-0-7695-4032-0
  • Electronic_ISBN
    1522-8681
  • Type

    conf

  • DOI
    10.1109/ASYNC.2010.27
  • Filename
    5476962