DocumentCode
2534308
Title
Multiple Bit Error Detection and Correction in GF Arithmetic Circuits
Author
Mathew, J. ; Banerjee, S. ; Mahesh, P. ; Pradhan, D.K. ; Jabir, A.M. ; Mohanty, S.P.
Author_Institution
Dept. of Comput. Sci., Univ. of Bristol, Bristol, UK
fYear
2010
fDate
20-22 Dec. 2010
Firstpage
101
Lastpage
106
Abstract
This paper presents a design technique for multiple bit error correctable (fault tolerant) polynomial basis (PB) multipliers over GF(2m). These multipliers are the building blocks in certain types of cryptographic hardware, e.g. the Elliptic Curve Crypto systems (ECC). One of the drawbacks in the existing techniques is their inability to correct multiple bit errors at the outputs. Also, much attention has been given to error detection, as opposed to error correction. However, owing to possible security threats induced by soft or transient faults in cryptographic hardware, in certain cases multiple bit error correction, as a way of mitigating attacks, is more important than detection. To this end, we use multiple parity predictions to detect multiple errors based on popular error correcting codes. First, we present a multiple error detection scheme using Low Density Parity Check Codes (LDPC). The expressions for the parity prediction are derived from the input operands, and are based on the primitive polynomials of the fields. For multiple bit error correction we use Reed Solomon codes. Comparison with traditional techniques shows improved area and power performance.
Keywords
Reed-Solomon codes; error correction; error detection; error statistics; parity check codes; GF arithmetic circuits; Reed Solomon codes; building blocks; cryptographic hardware; elliptic curve crypto systems; fault tolerant polynomial basis; input operands; multiple bit error correctable; multiple bit error correction; multiple bit error detection and correction; parity prediction; Circuit faults; Decoding; Error correction; Parity check codes; Polynomials; Reed-Solomon codes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System Design (ISED), 2010 International Symposium on
Conference_Location
Bhubaneswar
Print_ISBN
978-1-4244-8979-4
Electronic_ISBN
978-0-7695-4294-2
Type
conf
DOI
10.1109/ISED.2010.28
Filename
5715158
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