• DocumentCode
    2534333
  • Title

    An electrically-excited acoustic emission test technique for screening multilayer ceramic capacitors

  • Author

    Chan, Ning-Huat ; Rawal, Bharat S.

  • Author_Institution
    AVX Corp., Myrtle Beach, SC, USA
  • fYear
    1988
  • fDate
    9-11 May 1988
  • Firstpage
    502
  • Lastpage
    506
  • Abstract
    An AC-voltage-induced acoustic emission test technique for screening physical flaws, particularly delaminations, in various Z5U and X7R/BX ceramic capacitors was extensively evaluated. The test results showed that the severity of delaminations strongly coincided with the corresponding degree of severity in the acoustic signal. This led to a ten-times-higher rejection rate against the ceramic capacitors with delaminations in most of the screening tests. The source of acoustic waves was attributed to the partial discharge in delaminations, cracks, and pores due to the field intensification by the high-K dielectric materials. Almost identical patterns of behavior were found for acoustic emission and partial discharge with respect to the application of voltage and the chance of dielectric material
  • Keywords
    acoustic emission testing; capacitors; ceramics; electron device testing; 300 Hz; 60 Hz; AC-voltage-induced acoustic emission test technique; X7R/BX ceramic capacitors; Z5U multilayer ceramic capacitor; acoustic waves; cracks; delaminations; dielectric material; field intensification; partial discharge; physical flaws; screening tests; Acoustic emission; Acoustic signal detection; Acoustic testing; Acoustic waves; Capacitors; Ceramics; Delamination; Nonhomogeneous media; Thermal stresses; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Components Conference, 1988., Proceedings of the 38th
  • Conference_Location
    Los Angeles, CA
  • Type

    conf

  • DOI
    10.1109/ECC.1988.12639
  • Filename
    12639