• DocumentCode
    2534568
  • Title

    Progress on the R&D of fault current limiters for utility applications

  • Author

    Noe, M. ; Steurer, M. ; Eckroad, S. ; Adapa, R.

  • Author_Institution
    Inst. for Tech. Phys., Forschungszentrum Karlsruhe, Karlsruhe
  • fYear
    2008
  • fDate
    20-24 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Mechanical and thermal stresses caused by short-circuits are a major design criterion of electric power systems. Conditional impedance increase during a fault from new fault current limiter (FCL) devices can reduce short-circuit current levels significantly without adding additional impedance during normal operation. This paper updates on the present R&D status of new FCL technologies. At present, superconducting FCLs (SCFCLs) are being introduced commercially after first field tests of medium voltage demonstrators showed the technical feasibility. Different types of SCFCLs and non-superconducting FCLs have been developed in order to best fit the specific application requirements. Several FCL projects are investigated in order to illustrate and discuss the progress on the way to meet the two major R&D objectives: developing high voltage SCFCLs (Gt100 kV) and producing simple and low cost SCFCLs for medium voltage levels (6-36 kV).
  • Keywords
    fault current limiters; short-circuit currents; superconducting devices; thermal stresses; conditional impedance; electric power systems; fault current limiters; mechanical-thermal stresses; medium voltage demonstrators; short-circuit current levels; utility applications; voltage 6 kV to 36 kV; Fault current limiters; Fault currents; Impedance; Medium voltage; Research and development; Superconducting magnets; Superconductivity; Switches; Thermal stresses; US Department of Energy; Fault current limiter; short-circuit current; superconductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    1932-5517
  • Print_ISBN
    978-1-4244-1905-0
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2008.4596267
  • Filename
    4596267