• DocumentCode
    2534661
  • Title

    Accuracy in digital measurement of single-shot waveform

  • Author

    Kawamura, T. ; Ishii, M. ; Michishita, K.

  • Author_Institution
    Inst. of Ind. Sci., Tokyo Univ., Japan
  • fYear
    1988
  • fDate
    12-16 Sep 1988
  • Firstpage
    303
  • Abstract
    The single-shot waveform is often the object of high-voltage measurement. The estimation method must be established. It is important to know the quality of random error and to estimate the substantial resolution, called the EB (effective bits). The average method and revised average method are presented. It is shown that the revised average method is superior by experiment and simulation. The standardization of the digitizer in high-voltage measurement is discussed. The measuring accuracy in the worst case using raw data must be estimated for the standardization of the digitizer. The estimated measuring accuracy of Gaussian pulse in the worst case is presented. From these results a digitizer with optimum characteristics can be selected for the measurement of dielectric phenomena
  • Keywords
    dielectric measurement; digital instrumentation; high-voltage techniques; measurement errors; waveform analysis; Gaussian pulse; average method; dielectric phenomena; digital measurement; effective bits; high-voltage measurement; measuring accuracy; random error; revised average method; simulation; single-shot waveform; standardization; substantial resolution; Dielectric measurements; Equations; Erbium; Least squares methods; Measurement standards; Pulse measurements; Quantization; Standardization; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of
  • Conference_Location
    Beijing
  • Type

    conf

  • DOI
    10.1109/ICPADM.1988.38395
  • Filename
    38395