• DocumentCode
    2535215
  • Title

    Low-temperature sealing for optical microsystem packages using Au-Au surface activated bonding in atmospheric pressure environment

  • Author

    Yamamoto, S. ; Higurashi, E. ; Suga, T. ; Sawada, R.

  • Author_Institution
    Dept. of Precision Eng., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    1384
  • Lastpage
    1387
  • Abstract
    For chip-size packaging of optical microsystems, surface activated bonding (SAB) method is one attractive candidate because of its low-temperature process. However, most of packaging processes with SAB method have been performed under ultra-high vacuum conditions, because it needs maintaining the activated surface during bonding process. In this study, we demonstrate low-temperature hermetic sealing at atmospheric pressure using Au-Au SAB, because Au is not oxidized and its activated surface can be kept for several tens of minutes in ambient air. Strong bonding force and hermeticity were experimentally confirmed by low-temperature SAB bonding (150°C).
  • Keywords
    atmospheric pressure; bonding processes; chip scale packaging; hermetic seals; low-temperature techniques; atmospheric pressure environment; chip-size packaging; low-temperature hermetic sealing; low-temperature process; optical microsystem packages; surface activated bonding; ultra high vacuum conditions; Bonding; Gold; Plasma temperature; Silicon; Substrates; Testing; Hermetic packaging; Low-temperature bonding; Optical microsystem;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969529
  • Filename
    5969529