• DocumentCode
    2535360
  • Title

    Bend loss characterization of direct write rib waveguides induced in Ge0.2Se0.8 chalcogenide glass using electron beams

  • Author

    Hoffman, Galen B. ; Reano, Ronald M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2009
  • fDate
    4-8 Oct. 2009
  • Firstpage
    332
  • Lastpage
    333
  • Abstract
    Rib waveguides in Ge0.2Se0.8 films are fabricated by the direct write of electron beams. Numerical analysis shows that bend loss decreases with electron beam exposure count for constant bend radius.
  • Keywords
    chalcogenide glasses; electron beams; germanium compounds; numerical analysis; optical fabrication; optical losses; optical waveguides; Ge0.2Se0.8; bend loss; chalcogenide glass; direct write rib waveguides; electron beam exposure; numerical analysis; Electromagnetic waveguides; Electron beams; Glass; Magnetic materials; Optical films; Optical losses; Optical pulses; Pulsed laser deposition; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
  • Conference_Location
    Belek-Antalya
  • ISSN
    1092-8081
  • Print_ISBN
    978-1-4244-3680-4
  • Electronic_ISBN
    1092-8081
  • Type

    conf

  • DOI
    10.1109/LEOS.2009.5343258
  • Filename
    5343258
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2535360