• DocumentCode
    2535472
  • Title

    Multilevel flash memory on-chip error correction based on trellis coded modulation

  • Author

    Sun, Fei ; Devarajan, Siddharth ; Rose, Ken ; Zhang, Tong

  • Author_Institution
    Dept. of ECSE, Rensselaer Polytech. Inst.
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Abstract
    This paper presents a multilevel (ML) flash memory on-chip error correction system design based on the concept of trellis coded modulation (TCM). This is motivated by the non-trivial modulation process in ML memory storage and the effectiveness of TCM on integrating coding with modulation to provide better performance. Using code storage 2bits/cell flash memory as a test vehicle, the effectiveness of TCM-based systems, in terms of error-correcting performance, coding redundancy, silicon cost, and operation latency, has been successfully demonstrated
  • Keywords
    error correction; flash memories; redundancy; trellis coded modulation; multilevel flash memory; on-chip error correction system design; trellis coded modulation; Costs; Delay; Error correction codes; Flash memory; Modulation coding; Redundancy; Silicon; System testing; System-on-a-chip; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
  • Conference_Location
    Island of Kos
  • Print_ISBN
    0-7803-9389-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2006.1692867
  • Filename
    1692867