DocumentCode
2535842
Title
Multi-physics analysis for assembling of nano particle under the mixture condition of the dielectric fluid and AC electric field
Author
Kwon, Soon-Geun ; Kim, Soo-Hyun ; Yoo, Yeong-Eun ; Lee, Eung-Sug ; Han, Chang-Soo
Author_Institution
Korea Adv. Inst. of Sci. & Technol, Daejeon, South Korea
fYear
2004
fDate
16-19 Aug. 2004
Firstpage
547
Lastpage
549
Abstract
We report the multi-physics analysis results for assembling process of the carbon nanotube (CNT) to the AFM probe using dielectrophoresis. Analysis fields for this include fluid dynamics, electric field, and particle dynamics. We completed the coupled equations for multi-disciplinary regions and simulated the attraction procedure of carbon nanotubes in a dielectric medium under the non-uniform electric fields using FEA (finite element analysis) technique. Finally, the optimum assembling condition for CNT AFM tip was suggested.
Keywords
atomic force microscopy; carbon nanotubes; electrophoresis; finite element analysis; nanoparticles; nanotechnology; self-assembly; AC electric field; AFM probe; AFM tip; C; FEA; assembling process; carbon nanotube; dielectric fluid; dielectric medium; dielectrophoresis; finite element analysis; fluid dynamics; mixture; multiphysics analysis; nanoparticle; nonuniform electric fields; particle dynamics; Analytical models; Assembly; Carbon nanotubes; Dielectrics; Dielectrophoresis; Electric fields; Equations; Fluid dynamics; Nonuniform electric fields; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN
0-7803-8536-5
Type
conf
DOI
10.1109/NANO.2004.1392415
Filename
1392415
Link To Document