• DocumentCode
    2535842
  • Title

    Multi-physics analysis for assembling of nano particle under the mixture condition of the dielectric fluid and AC electric field

  • Author

    Kwon, Soon-Geun ; Kim, Soo-Hyun ; Yoo, Yeong-Eun ; Lee, Eung-Sug ; Han, Chang-Soo

  • Author_Institution
    Korea Adv. Inst. of Sci. & Technol, Daejeon, South Korea
  • fYear
    2004
  • fDate
    16-19 Aug. 2004
  • Firstpage
    547
  • Lastpage
    549
  • Abstract
    We report the multi-physics analysis results for assembling process of the carbon nanotube (CNT) to the AFM probe using dielectrophoresis. Analysis fields for this include fluid dynamics, electric field, and particle dynamics. We completed the coupled equations for multi-disciplinary regions and simulated the attraction procedure of carbon nanotubes in a dielectric medium under the non-uniform electric fields using FEA (finite element analysis) technique. Finally, the optimum assembling condition for CNT AFM tip was suggested.
  • Keywords
    atomic force microscopy; carbon nanotubes; electrophoresis; finite element analysis; nanoparticles; nanotechnology; self-assembly; AC electric field; AFM probe; AFM tip; C; FEA; assembling process; carbon nanotube; dielectric fluid; dielectric medium; dielectrophoresis; finite element analysis; fluid dynamics; mixture; multiphysics analysis; nanoparticle; nonuniform electric fields; particle dynamics; Analytical models; Assembly; Carbon nanotubes; Dielectrics; Dielectrophoresis; Electric fields; Equations; Fluid dynamics; Nonuniform electric fields; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2004. 4th IEEE Conference on
  • Print_ISBN
    0-7803-8536-5
  • Type

    conf

  • DOI
    10.1109/NANO.2004.1392415
  • Filename
    1392415