• DocumentCode
    25380
  • Title

    SEU Hardened Flip-Flop Based on Dynamic Logic

  • Author

    SheXiao Xuan ; Li, Ning ; Tong, Junmin

  • Author_Institution
    Sch. of Microelectron., Fudan Univ., Shanghai, China
  • Volume
    60
  • Issue
    5
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    3932
  • Lastpage
    3936
  • Abstract
    A conventional master-slave flip-flop is very sensitive to particle strike that causes an SEU. When the clock is high, an SEU may upset the logic state of the master latch resulting in a faulty output of this flip-flop, and the erroneous value will also be locked in the slave latch when clock is low. When the clock is low, an SEU may also upset the logic state of the slave latch, resulting in a faulty output of this flip-flop. This paper presents an SEU hardened flip-flop that can mitigate SEU using an error detection circuit and a multiplexer. When the clock is high or low, an SEU in the master or slave latch of a flip-flop can be detected by the error detection circuit using dynamic logic. The multiplexer selects a correct output according to the error indication signal. The proposed flip-flop has small area, power and delay overheads and good radiation hardening capabilities.
  • Keywords
    detector circuits; flip-flops; multiplexing equipment; radiation hardening (electronics); SEU hardened flip-flop; delay overheads; dynamic logic; error detection circuit; error indication signal; logic state; master latch; master-slave flip-flop; multiplexer; radiation hardening capability; single event upset; slave latch; Circuit faults; Clocks; Delays; Latches; Logic gates; MOS devices; Single event upsets; Flip-flop; hardened by design; radiation effects; single event upset (SEU);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2281138
  • Filename
    6609083