DocumentCode
25380
Title
SEU Hardened Flip-Flop Based on Dynamic Logic
Author
SheXiao Xuan ; Li, Ning ; Tong, Junmin
Author_Institution
Sch. of Microelectron., Fudan Univ., Shanghai, China
Volume
60
Issue
5
fYear
2013
fDate
Oct. 2013
Firstpage
3932
Lastpage
3936
Abstract
A conventional master-slave flip-flop is very sensitive to particle strike that causes an SEU. When the clock is high, an SEU may upset the logic state of the master latch resulting in a faulty output of this flip-flop, and the erroneous value will also be locked in the slave latch when clock is low. When the clock is low, an SEU may also upset the logic state of the slave latch, resulting in a faulty output of this flip-flop. This paper presents an SEU hardened flip-flop that can mitigate SEU using an error detection circuit and a multiplexer. When the clock is high or low, an SEU in the master or slave latch of a flip-flop can be detected by the error detection circuit using dynamic logic. The multiplexer selects a correct output according to the error indication signal. The proposed flip-flop has small area, power and delay overheads and good radiation hardening capabilities.
Keywords
detector circuits; flip-flops; multiplexing equipment; radiation hardening (electronics); SEU hardened flip-flop; delay overheads; dynamic logic; error detection circuit; error indication signal; logic state; master latch; master-slave flip-flop; multiplexer; radiation hardening capability; single event upset; slave latch; Circuit faults; Clocks; Delays; Latches; Logic gates; MOS devices; Single event upsets; Flip-flop; hardened by design; radiation effects; single event upset (SEU);
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2013.2281138
Filename
6609083
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