• DocumentCode
    253877
  • Title

    PatchMatch Based Joint View Selection and Depthmap Estimation

  • Author

    Enliang Zheng ; Dunn, Enrique ; Jojic, Vladimir ; Frahm, Jan-Michael

  • Author_Institution
    Univ. of North Carolina at Chapel Hill, Chapel Hill, NC, USA
  • fYear
    2014
  • fDate
    23-28 June 2014
  • Firstpage
    1510
  • Lastpage
    1517
  • Abstract
    We propose a multi-view depthmap estimation approach aimed at adaptively ascertaining the pixel level data associations between a reference image and all the elements of a source image set. Namely, we address the question, what aggregation subset of the source image set should we use to estimate the depth of a particular pixel in the reference image? We pose the problem within a probabilistic framework that jointly models pixel-level view selection and depthmap estimation given the local pairwise image photoconsistency. The corresponding graphical model is solved by EM-based view selection probability inference and PatchMatch-like depth sampling and propagation. Experimental results on standard multi-view benchmarks convey the state-of-the art estimation accuracy afforded by mitigating spurious pixel level data associations. Additionally, experiments on large Internet crowd sourced data demonstrate the robustness of our approach against unstructured and heterogeneous image capture characteristics. Moreover, the linear computational and storage requirements of our formulation, as well as its inherent parallelism, enables an efficient and scalable GPU-based implementation.
  • Keywords
    estimation theory; expectation-maximisation algorithm; graph theory; image fusion; image matching; image sampling; probability; EM-based view selection probability inference; GPU; graphical model; heterogeneous image capture characteristics; large Internet crowd sourced data; local pairwise image photoconsistency; multiview depthmap estimation approach; patch match based joint view selection; patch match-like depth propagation; patch match-like depth sampling; pixel level data associations; pixel-level view selection; probabilistic framework; reference image; source image set; spurious pixel level data association mitigation; Estimation; Hidden Markov models; Image color analysis; Joints; Optimized production technology; Robustness; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/CVPR.2014.196
  • Filename
    6909592