DocumentCode
2538988
Title
A novel low-profile low-parasitic RF package using high-density build-up technology
Author
Wei, Chien-Cheng ; Lin, Ming-Chien ; Fan, Chin-Ta ; Chiang, Ta-Hsiang ; Chiu, Ming-Kuen ; Ru, Shao-Pin ; Ni, Nan ; Cardona, Albert
Author_Institution
Taipei Hsien, Tong Hsing Electron. Ind., Ltd., Taipei, Taiwan
fYear
2010
fDate
23-25 May 2010
Firstpage
581
Lastpage
584
Abstract
This paper presents a low-profile low-parasitic RF package by using the high-density build-up (HD-BU) technology. This package achieves much thinner, fine pitch, and exposed design pattern feature for outstanding electrical and thermal performance. The packaging fabrication is simple and only needs several processes. This HD-BU package provides lower parasitic than other lead-frame types due to the use of very thin bonding pads. Additionally, a capacitor chip is assembled using the proposed technology for packaging demonstration and electrical performance evaluation. Based on the experimental results, the measured capacitances at 1-GHz are quite similar before and after packaging. It indicates that the HD-BU package has low parasitic capacitance even at high-frequency operation, and does not affect the electrical performance for the packaged chip. Therefore, these packages are good candidates for applications requiring low profile, low parasitic and low cost.
Keywords
capacitors; electronics packaging; capacitor chip; design pattern feature; electrical performance evaluation; high density build-up technology; high-density build-up technology; low parasitic capacitance; low profile low parasitic RF package; packaged chip; packaging demonstration; packaging fabrication; Assembly; Bonding; Capacitance measurement; Capacitors; Costs; Fabrication; Packaging; Parasitic capacitance; Radio frequency; Semiconductor device measurement; BST varactor; High-density build-up; RF package; lead-frame;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location
Anaheim, CA
ISSN
1529-2517
Print_ISBN
978-1-4244-6240-7
Type
conf
DOI
10.1109/RFIC.2010.5477358
Filename
5477358
Link To Document