• DocumentCode
    2539232
  • Title

    Integration of multi-standard front end modules SOCs on high resistivity SOI RF CMOS technology

  • Author

    Gianesello, F. ; Boret, S. ; Martineau, B. ; Durand, C. ; Pilard, R. ; Gloria, D. ; Rauber, B. ; Raynaud, C.

  • Author_Institution
    TR&D, STMicroelectronics, Crolles, France
  • fYear
    2010
  • fDate
    23-25 May 2010
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    RF front end modules (FEMs) are currently realized using a variety of technologies. However, since integration drives wireless business in order to achieve the appropriate cost and form factor, we see significant research concerning FEM integration on silicon. In this quest, SOI technology has already addressed two key blocks, the antenna switch and the power amplifier. In this paper, we will focus our investigation on high performance passive functions in order to demonstrate the capability of SOI CMOS technology to integrate the whole FEM. To do so, balun, harmonic filter, diplexer and directional coupler have been achieved in a 130 nm SOI CMOS technology. Measured performances are clearly competitive with most commercially available Integrated Passive Device (IPD) solutions, which paves the way of FEM silicon SOCs.
  • Keywords
    CMOS integrated circuits; power amplifiers; silicon-on-insulator; system-on-chip; RF front end modules; antenna switch; balun; diplexer; directional coupler; harmonic filter; high performance passive function; high resistivity SOI RF CMOS technology; integrated passive device solution; multi-standard front end modules SOC; power amplifier; Business; CMOS technology; Conductivity; Costs; Harmonic filters; Impedance matching; Power amplifiers; Radio frequency; Silicon; Switches; Front End Module; High Resistivity; SOI; balun; coupler; diplexer; harmonic filter; integrated passive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-6240-7
  • Type

    conf

  • DOI
    10.1109/RFIC.2010.5477370
  • Filename
    5477370