Power Management Device Characteristics for Semiconductor Test Instrumentation

Common-mode and magnetic emission performance of isolated dc-dc converter modules are identified as parameters critical to the success of next-generation semiconductor test architecture. Specification and application data from commercial suppliers does not include these parameters - making characterization necessary. This paper provides a brief analysis of system architecture leading to a proposalfor a set of dc-dc converter measurements that enable system design - including a new approach to common mode current measurement. Data from commercially available devices is provided to demonstrate the need for characterization in test instrumentation applications.