DocumentCode
2541305
Title
Remote microscale teleoperation through virtual reality and haptic feedback
Author
Bolopion, Aude ; Stolle, Christian ; Tunnell, Robert ; Haliyo, Sinan ; Régnier, Stéphane ; Fatikow, Sergej
Author_Institution
Inst. des Syst. Intelligents et de Robot., Univ. Pierre et Marie Curie - Paris 6, Jussieu, France
fYear
2011
fDate
25-30 Sept. 2011
Firstpage
894
Lastpage
900
Abstract
This paper reports the remote handling of microscale objects, between two sites approximately 630 km distant. To manipulate objects less than 10 ??m, specific equipments such as AFM (Atomic Force Microscope) cantilevers integrated into a SEM (Scanning Electron Microscope) are generally required. Enabling remote access to such a system would benefit any micro/nanoresearcher. However, vision feedback and sensor data of a micromanipulation system are generally limited, hence the implementation of a teleoperation scenario is not straightforward. Specific tools are proposed here for an intuitive manipulation in a wide range of applications. To ensure ease of manipulation, both a 3D virtual representation of the scene and haptic feedback are provided. Force sensor feedback is limited since only two measures are available. In order to extend this information, vision algorithms are developed to estimate the respective positions of the tool and objects, which are then used to calculate the haptic feedback. The stability of the overall scheme is very sensitive to time delays. This requirement is taken into account in vision algorithms and the communication module which transfers the data between the two remote sites. In addition, the proposed robotic control architecture is modular so that the platform can be used for a wide range of applications. First results are obtained on a teleoperation between Paris, France, and Oldenburg, Germany.
Keywords
atomic force microscopy; cantilevers; delays; force feedback; force sensors; micromanipulators; robot vision; scanning electron microscopes; telerobotics; virtual reality; 3D virtual representation; AFM cantilevers; SEM; atomic force microscope; data transfer; force sensor feedback; haptic feedback; micromanipulation system; microscale object; remote handling; remote microscale teleoperation; robotic control architecture; scanning electron microscope; sensor data; time delay; virtual reality; vision algorithm; Force; Force measurement; Haptic interfaces; Scanning electron microscopy; Substrates; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Robots and Systems (IROS), 2011 IEEE/RSJ International Conference on
Conference_Location
San Francisco, CA
ISSN
2153-0858
Print_ISBN
978-1-61284-454-1
Type
conf
DOI
10.1109/IROS.2011.6094453
Filename
6094453
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