• DocumentCode
    254321
  • Title

    Comprehensive empirical model for evaluation of the series resistance of a solar cell

  • Author

    Nian Chen ; Chowdhury, A.A. ; Ebong, A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
  • fYear
    2014
  • fDate
    15-17 Dec. 2014
  • Firstpage
    214
  • Lastpage
    218
  • Abstract
    This paper reports on the empirical model for series resistance (Rs) of a screen-printed silicon solar cell with segmented metal grids. Due to the quasi-Gaussian shape of gridline cross section, a mathematical expression of the practical cross section of gridline was implemented instead of the simple rectangular shape. And segmentations of gridlines and busbars were introduced to assess the impact on series resistance and solar cell performance. The advantage of this evaluation can be taken to determine the optimal metal grid design in terms of grid geometries and distributions of metal electrodes. It was found that for an industrial size monocrystalline silicon solar cell with 3 busbars having a width of 1.5 mm, and 92 gridlines of ~50°m width, the optimal segmentation for gridlines should be ~0.67 mm, and for busbars should be the line spacing. A further study reveals that the segmentations in busbars has much larger impact on efficiency than gridlines.
  • Keywords
    electric resistance; electrodes; elemental semiconductors; silicon; solar cells; Si; busbars segmentations; grid geometries; gridline cross section; gridlines segmentations; line spacing; metal electrode distributions; optimal metal grid design; quasiGaussian shape; screen printed silicon solar cell; segmented metal grids; series resistance empirical model; size 1.5 mm; solar cell series resistance; Photovoltaic cells; Resists; Shadow mapping; busbar; gridline; segmentation; series resistance; silicon solar cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-capacity Optical Networks and Emerging/Enabling Technologies (HONET), 2014 11th Annual
  • Conference_Location
    Charlotte, NC
  • Print_ISBN
    978-1-4799-6939-5
  • Type

    conf

  • DOI
    10.1109/HONET.2014.7029394
  • Filename
    7029394