DocumentCode
2544732
Title
Energy dependence of scintillation decay time measured with gamma-rays and compton electrons
Author
Swiderski, L. ; Iwanowska, J. ; Moszynski, M. ; Sibczynski, P. ; Szawlowski, M. ; Szczesniak, T.
Author_Institution
Nat. Centre for Nucl. Res., Otwock-Swierk, Poland
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
302
Lastpage
304
Abstract
The relation between non proportional response of the scintillators and their energy resolution has been extensively studied in the last years. However, there is not much data on the scintillation decay characteristics as a function of the energy deposited in the scintillator. This study presents a simple experimental setup for direct registration of the scintillation pulse shapes. The tested scintillators are coupled to a photomultiplier. Anode pulses are recorded directly by a digital oscilloscope. The scope is triggered by a logic signal from a single channel analyzer, employed to ensure precise selection of the energy deposit. The study is aimed at investigating the decay time constants and intensities of scintillation decay components as a function of the energy deposited in the scintillator. The differences in the pulse shapes generated in the Compton scattering and photoabsorption processes are also inspected. In this study we present the results of the test case study performed for NaI:TI scintillator.
Keywords
Compton effect; photoexcitation; photomultipliers; solid scintillation detectors; Compton electrons; Compton scattering process; NaI:TI scintillator; anode pulses; digital oscilloscope; energy resolution; gamma-rays; logic signal; photoabsorption process; photomultiplier; scintillation decay characteristics; scintillation decay components; scintillation decay time; scintillation pulse shapes; scintillator proportional response; single channel analyzer; NaI:Tl; electron response; gamma-ray; scintillation decay time;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551111
Filename
6551111
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