• DocumentCode
    2544845
  • Title

    Advance simulation and optimization of high power lnGaN/GaN laser diodes

  • Author

    Ranade, Yogiraj M. ; Khazir, Muhammad ; Raja, M. Yasin Akhtar

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
  • fYear
    2010
  • fDate
    19-21 Dec. 2010
  • Firstpage
    115
  • Lastpage
    120
  • Abstract
    The optimization of InGaN/GaN multiquantum wells structure based on Si-doped GaN substrate for λ~445 nm is performed. Advance simulation for a self-consistent laser model combined with band-structure and free-carrier gain calculations is employed to study effects such as waveguiding, carrier transport and heat flux. Enhancement in output power of the optimized structure is calculated. It has been found that electron leakage into the p-doped ridge is the major limiting factor for high output power. The non-uniformity of the carrier distribution among quantum wells is believed to be responsible for undesired absorption. Noticeable improvement in the threshold currents and corresponding substantial enhancement in the optical output power have been achieved.
  • Keywords
    III-V semiconductors; band structure; gallium compounds; indium compounds; semiconductor lasers; semiconductor quantum wells; GaN:Si; InGaN-GaN; band structure; carrier distribution; carrier transport; electron leakage; free-carrier gain; heat flux; high power laser diodes; multiquantum wells; output power enhancement; p-doped ridge; self-consistent laser model; threshold currents; waveguiding; Gallium nitride; Optical refraction; Optical variables control; Power generation; Quantum well devices; Substrates; Threshold current; carriers confirnement; elctron-block layer(EBL); multiple quantum wells; optical gain; polarization field; threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Capacity Optical Networks and Enabling Technologies (HONET), 2010
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-9922-9
  • Type

    conf

  • DOI
    10.1109/HONET.2010.5715756
  • Filename
    5715756