DocumentCode
2545188
Title
Evaluation of X-ray imaging properties of structured aluminum oxide matrices filled with different scintillator materials
Author
Muhlbauer, Jorg ; Semmelroth, Kurt ; Kruger, Philipp ; Schreiber, J. ; Mukhurov, Nikolai I. ; Uhlmann, Norman
Author_Institution
Dev. Center X-ray Technol., Fraunhofer Inst. for Integrated Circuits lIS, Furth, Germany
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
399
Lastpage
401
Abstract
The spatial resolution of currently commercially available X-ray scintillators is limited by their thickness. For instance a scintillator with a high thickness, yields a high efficiency but suffers from a decrease in spatial resolution due to (optical) light spreading in the scintillation layer. For thinner scintillators the opposing case is observed. The filling of structures like self-organized aluminum oxide (Alox), permits the fabrication of very thick and therefore highly efficient scintillator matrices without losing spatial resolution, due to the matrix\´ channel-like structures which act as light guides. We filled such structured Alox-matrices with different scintillator materials with two different methods. Non-hygroscopic scintillators like GOS or LSO can by filled into the matrices by a sedimentation process, but hygroscopic materials like CsI:TI require a "dry" process like melting. The focus of this paper is on the evaluation of the X-ray imaging properties of these filled matrices with respect to the achievable spatial resolution and signal-to-noise ratio. Especially for the CsI:TI filled matrix we also studied the optical emission spectra, due to a loss of the dopant thallium during the melting process.
Keywords
X-ray detection; X-ray imaging; scintillation counters; X-ray imaging properties; X-ray scintillators; dopant thallium; highly efficient scintillator matrices; hygroscopic materials; matrix channel-like structures; melting process; optical emission spectra; scintillation layer; scintillator materials; self-organized aluminum oxide; signal-to-noise ratio; spatial resolution; structured aluminum oxide matrices;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551132
Filename
6551132
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