• DocumentCode
    2547851
  • Title

    The hyper-geometric distribution software reliability growth model (HGDM): precise formulation and applicability

  • Author

    Jacoby, Raymond ; Tohma, Yoshihiro

  • Author_Institution
    Dept. of Comput. Sci., Tokyo Inst. of Technol., Japan
  • fYear
    1990
  • fDate
    31 Oct-2 Nov 1990
  • Firstpage
    13
  • Lastpage
    19
  • Abstract
    The hyper-geometric distribution is used to estimate the number of initial faults residual in software at the beginning of the test-and-debug phase. The hyper-geometric distribution growth model (HGD model) is well suited to making estimates for the observed growth curves of the accumulated number of detected faults. The advantage of the proposed model is the applicability to all kinds of observed data. By application of a single model, exponential growth curves as well as S-shaped growth curves can be estimated. The precise formulation of the HGD model is presented. The exact relationship of this model to the NHPP Goel-Okumoto growth model and the delayed S-shaped growth model is shown. With the introduction of a variable fault detection rate, the goodness of fit of the estimated growth curve to the growth curve of real observed faults is increased significantly. Different examples of the applicability of the model to real observed data are presented
  • Keywords
    software reliability; statistical analysis; NHPP Goel-Okumoto growth model; S-shaped growth curves; delayed S-shaped growth model; exponential growth curves; fault detection rate; goodness of fit; hyper-geometric distribution software reliability growth model; initial faults; observed growth curves; test-and-debug phase; Application software; Computer science; Delay; Fault detection; Jacobian matrices; Phase estimation; Software debugging; Software reliability; Software testing; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference, 1990. COMPSAC 90. Proceedings., Fourteenth Annual International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-8186-2054-4
  • Type

    conf

  • DOI
    10.1109/CMPSAC.1990.139307
  • Filename
    139307