Role of semiconducting compounds in the premature aging of XLPE cable insulation

Author

Mashikian, Matthew S. ; Groeger, Joseph H. ; Dale, Steinar ; Ildstad, Erling

Author_Institution

Inst. of Mater. Sci., Connecticut Univ., Storrs, CT, USA

fYear

1988

fDate

5-8 June 1988

Firstpage

314

Lastpage

320

Abstract

A clean, crosslinked polyethylene insulating material was sandwiched between two parallel layers of semiconducting shield compound in test cells which simulated extruded medium-voltage cables. Four commercial and four experimental semiconducting compounds were used. Cells were aged at 60 Hz, with a stress of 2.6 kV/mm (65 V/mil) or 3.4 kV/mm (85 V/mil), with one shielding layer exposed to air and the other exposed to distilled, deionized water. The effects of water soluble impurities in the semiconducting compounds on the number, size, and location of water trees developed in the insulation, at the semiconducting shield interfaces, are discussed. The movement of soluble impurities is also addressed.<>

Keywords

ageing; cable insulation; electric breakdown of solids; insulation testing; organic insulating materials; polymers; 60 Hz; XLPE cable insulation; crosslinked polyethylene insulating material; extruded medium-voltage cables; premature aging; semiconducting compounds; shielding layer; test cells; water soluble impurities; water trees; Aging; Cable insulation; Cables; Materials testing; Medium voltage; Polyethylene; Semiconductivity; Semiconductor device testing; Semiconductor impurities; Semiconductor materials;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on

Conference_Location

Cambridge, MA, USA

ISSN

1089-084X

Type

conf

DOI

10.1109/ELINSL.1988.13931

Filename

13931