DocumentCode
2550392
Title
Current-voltage characteristics of Schottky diodes: topology of relationships between relevant parameters
Author
arobár, F. ; Prochazkova, O.
Author_Institution
Inst. of Radio Eng. & Electron., Acad. of Sci. of the Czech Republic, Praha, Czech Republic
fYear
2002
fDate
14-16 Oct. 2002
Firstpage
341
Lastpage
344
Abstract
A modified method of the signal flow graphs is used to visualize the causal relationships in the thermionic model of current flow in the metal-semiconductor contact. A bias-dependent barrier and internal resistance are assumed. The representative diagram contains two branches connecting the input voltage vertex V with the output current vertex J and a feedback loop attached to the output vertex and connected with the vertex R of the internal resistance. The mathematical apparatus coming with the diagrammatic method is used to evaluate current-voltage characteristics and the so-called transmission functions of diagram lines, in particular of the ones assigned to the VJ edge and the loop, under various conditions. The transmission function of the loop is always negative (which excludes possibility of sigmoidal J-V characteristics) and its influence is significant only at the upper end of the physically admissible voltage region.
Keywords
Schottky barriers; Schottky diodes; graph theory; semiconductor device models; semiconductor-metal boundaries; topology; Schottky diodes; bias-dependent barrier; causal relationships; current flow; current-voltage characteristics; diagrammatic method; feedback loop; input voltage; input voltage vertex; internal resistance; metal-semiconductor contact; output current vertex; signal flow graphs; thermionic model; topology; transmission functions; Circuit topology; Current-voltage characteristics; Feedback loop; Joining processes; Physics; Schottky barriers; Schottky diodes; Thermionic emission; Visualization; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
Print_ISBN
0-7803-7276-X
Type
conf
DOI
10.1109/ASDAM.2002.1088539
Filename
1088539
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