• DocumentCode
    2551799
  • Title

    The performance of the CMS photon and electron level-1 trigger

  • Author

    Thea, Alessandro

  • Author_Institution
    Inst. for Particle Phys., ETH Zurich, Zurich, Switzerland
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    1791
  • Lastpage
    1795
  • Abstract
    Throughout the year 2011, the Large Hadron ColIider (LHC) has operated with an instantaneous luminosity that has risen continually to around 4 × 1033 cm-2 s-1. With this prodigious high-energy proton collisions rate, efficient triggering on electrons and photons has become a major challenge for the LHC experiments. The Compact Muon Solenoid (CMS) experiment implements a sophisticated two-level online selection system that achieves a rejection factor of nearly 106. The first level (LI) is based on coarse information coming from the calorimeters and the muon detectors while the High-Level Trigger (HLT) combines fine-grain information from all sub-detectors. In this intense hadronic environment, the LI electron/photon trigger provides a powerful tool to select interesting events. It is based upon information from the Electromagnetic Calorimeter (ECAL), a high-resolution detector comprising 75848 lead tungstate (PbWO4) crystals in a "barrel" and two "endcaps". The performance as well as the optimization of the electron/photon trigger are presented.
  • Keywords
    nuclear electronics; particle calorimetry; position sensitive particle detectors; trigger circuits; 75848 lead tungstate crystals; CMS electron level-1 trigger; CMS photon level-1 trigger; Compact Muon Solenoid experiment; LHC experiments; Large Hadron ColIider; electromagnetic calorimeter; electron-photon trigger; fine-grain information; high-energy proton collisions rate; high-level trigger; high-resolution detector; instantaneous luminosity; muon detectors; two-level online selection system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551419
  • Filename
    6551419