• DocumentCode
    2552048
  • Title

    Accuracy improvement of the S-parameter adjoint sensitivity analysis for shape parameters

  • Author

    Zhu, Xiaying ; Nikolova, Natalia K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    529
  • Lastpage
    532
  • Abstract
    The electromagnetic adjoint-based sensitivity analysis uses an exact formula in the case of material parameters, which yields sensitivity accuracy comparable to that of the numerical field solution. For shape parameters, however, the non-analytical adjoint approaches rely on a field approximation - the adjoint-field mapping, which may affect the accuracy of the computed sensitivity. We show that in the self-adjoint S-parameter sensitivity analysis, this approximation affects the accuracy of the transmission coefficients only (i.e., Skj, k ne j). We show that the averaging of the sensitivity estimates for the assumed forward and backward perturbations improves significantly the accuracy making it comparable to that of the exact sensitivities. Examples include a waveguide dielectric-resonator filter and a waveguide impedance transformer. The field analysis is performed with a commercial finite-element solver while the sensitivity analysis is performed in MATLABreg.
  • Keywords
    S-parameters; computational electromagnetics; finite difference time-domain analysis; sensitivity analysis; S-parameter adjoint sensitivity analysis; adjoint-field mapping; electromagnetic adjoint-based sensitivity analysis; field approximation; finite-difference frequency-domain method; finite-element solver; shape parameter; transmission coefficient; waveguide dielectric-resonator filter; waveguide impedance transformer; Dielectrics; Electromagnetic fields; Electromagnetic waveguides; Filters; Finite element methods; Impedance; Performance analysis; Scattering parameters; Sensitivity analysis; Shape; Sensitivity analysis; finite-difference frequency-domain (FDFD) method; self-adjoint sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165750
  • Filename
    5165750