DocumentCode
2552441
Title
Research on the associated feature of APD sensor avalanche gain and photoelectric conversion SNR
Author
Liang Xiaolong ; Su Zhen ; Bi Shanpeng
Author_Institution
Coll. of Inf. & Eng., Commun. Univ. of China, Beijing, China
fYear
2012
fDate
29-31 May 2012
Firstpage
1913
Lastpage
1916
Abstract
The source of APD photodiode sensor working noise and changes of photoelectric conversion SNR (Signal-to-noise ratio) are analyzed and computed in detail. The paper emphatically introduces the associated feature of APD sensor avalanche gain and photoelectric conversion SNR. Then the determination method of optimum avalanche multiplication rate on various noise factors is discussed. It can be seen from the research report that the optimum avalanche multiplication rate tends to reduce while the photocurrent Ip increases. Photoelectric conversion SNR decreases as APD operation bandwidth increases while the optimum avalanche multiplication rate remains unchanged. It has great theoretical significance and use value for determining and controlling APD sensor´s characteristic of photoelectric transforming and so as to the design of low-noise interface circuit.
Keywords
avalanche photodiodes; photodetectors; APD operation bandwidth; APD photodiode sensor; APD sensor avalanche gain; SNR; low-noise interface circuit; noise factors; optimum avalanche multiplication rate; photocurrent; photoelectric conversion; signal-to-noise ratio; Bandwidth; Equations; Photoconductivity; Photodiodes; Signal to noise ratio; Thermal noise; APD photodiode; avalanche gain; excess noise; high sensitivity photoelectric sensor; multiplication rate; signal-to-noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Systems and Knowledge Discovery (FSKD), 2012 9th International Conference on
Conference_Location
Sichuan
Print_ISBN
978-1-4673-0025-4
Type
conf
DOI
10.1109/FSKD.2012.6234306
Filename
6234306
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