DocumentCode
2552481
Title
Packaging effects on the figure of merit of a CMOS cascode low-noise amplifier: Flip-chip versus wire-bond
Author
Han, Fu-Yi ; Lu, Kung-Chung ; Horng, Tzyy-Sheng ; Lin, Jenshan ; Cheng, Hung-Hsiang ; Chiu, Chi-Tsung ; Hung, Chih-Pin
Author_Institution
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
fYear
2009
fDate
7-12 June 2009
Firstpage
601
Lastpage
604
Abstract
A comprehensive study is presented to compare the effects between flip-chip and wire-bond packages on a front-end cascode low-noise amplifier (LNA) in a 2.4 GHz CMOS wireless local area network (WLAN) receiver. To construct the package electrical models, specific modeling dies are designed to help extract the equivalent-circuit elements from measured S-parameters for chip-package interconnects. Furthermore, the ground-proximity effect on on-chip spiral inductors in a flip-chip package is presented for the first time in this modeling study. For practical applications, the established package models are used in a chip-package co-simulation to predict the degradation of figure of merit for the cascode LNA under packaged condition.
Keywords
CMOS integrated circuits; S-parameters; equivalent circuits; flip-chip devices; integrated circuit interconnections; lead bonding; low noise amplifiers; proximity effect (lithography); radiofrequency integrated circuits; wireless LAN; CMOS cascode low-noise amplifier; CMOS wireless local area network receiver; S-parameters measurement; chip-package co-simulation; chip-package interconnects; equivalent-circuit elements; flip-chip package; frequency 2.4 GHz; front-end cascode low-noise amplifier; ground-proximity effect; modeling dies; on-chip spiral inductors; package electrical models; packaging effects; wire-bond package; Electric variables measurement; Inductors; LAN interconnection; Low-noise amplifiers; Packaging; Scattering parameters; Semiconductor device measurement; Semiconductor device modeling; Spirals; Wireless LAN; Cascode LNA; chip-package co-simulation; figure of merit; flip-chip package; package model; wire-bond package;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location
Boston, MA
ISSN
0149-645X
Print_ISBN
978-1-4244-2803-8
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2009.5165768
Filename
5165768
Link To Document