• DocumentCode
    2552963
  • Title

    A V-band low-phase-noise CMOS oscillator using a micromachined cavity

  • Author

    Koh, Yumin ; Song, Sangsub ; Jihoon Kim ; Kim, Youngmin ; Kwon, Youngwoo ; Seo, Kwang-Seok

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    689
  • Lastpage
    692
  • Abstract
    This paper presents a low-phase-noise CMOS oscillator integrated on a thin-film substrate with flip-chip interconnection. The cavity serves as a parallel-feedback element, which is fabricated using micromachining technique and is applied to the newly developed current probe scheme to reduce the coupling loss between a cavity and external circuits. The cavity was designed to have a coupling of 6 dB at a resonant frequency of 56 GHz. CMOS LNA using 0.13 mum 1P8M CMOS technology was used as a gain block to generate negative resistance. The developed CMOS oscillator has a large output power of -3.7 dBm and a low phase noise of -106 dBc/Hz at 1 MHz offset with an oscillation frequency of 55.77 GHz.
  • Keywords
    CMOS integrated circuits; flip-chip devices; integrated circuit interconnections; low noise amplifiers; micromachining; oscillators; CMOS LNA; CMOS technology; V-band low-phase-noise CMOS oscillator; coupling loss; flip-chip interconnection; frequency 55.77 GHz; frequency 56 GHz; micromachined cavity; micromachining technique; negative resistance; oscillation frequency; parallel-feedback element; resonant frequency; thin-film substrate; CMOS technology; Coupling circuits; Integrated circuit interconnections; Micromachining; Oscillators; Power generation; Probes; Resonant frequency; Substrates; Thin film circuits; CMOS oscillator; current probe; flip-chip interconnection; micromachined cavity; thin-film substrate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165790
  • Filename
    5165790