Seventh International Workshop on Microprocessor Test and Verification - Cover

fYear

2006

fDate

4-5 Dec. 2006

Abstract

The following topics are dealt with: microprocessor test generation; microprocessor chip verification.

Keywords

integrated circuit testing; microprocessor chips; microprocessor chip verification; microprocessor test generation;

fLanguage

English

Publisher

ieee

Conference_Titel

Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on

Conference_Location

Austin, TX

ISSN

1550-4093

Print_ISBN

0-7695-2839-2

Type

conf

DOI

10.1109/MTV.2006.16

Filename

4197207

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