DocumentCode
2553928
Title
Seventh International Workshop on Microprocessor Test and Verification-Title
fYear
2006
fDate
4-5 Dec. 2006
Abstract
The following topics are discussed: microprocessor test and verification; test generation; architectural and design issues; and design error debugging and diagnosis.
Keywords
computer architecture; fault diagnosis; integrated circuit design; integrated circuit testing; microprocessor chips; design error debugging; design error diagnosis; microprocessor architecture; microprocessor design; microprocessor test; microprocessor verification; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
Conference_Location
Austin, TX
ISSN
1550-4093
Print_ISBN
0-7695-2839-2
Type
conf
DOI
10.1109/MTV.2006.17
Filename
4197208
Link To Document