• DocumentCode
    2554587
  • Title

    Fabrication of thin layer membrane using CMOS process for very low pressure sensor applications

  • Author

    Buyong, Muhamad Ramdzan ; Aziz, Norazreen Abd ; Majlis, Burhanuddin Yeop

  • Author_Institution
    Inst. of Microeng. & Nanoelectron., Univ. Kebangsaan Malaysia, Bangi
  • fYear
    2008
  • fDate
    25-27 Nov. 2008
  • Firstpage
    363
  • Lastpage
    369
  • Abstract
    A very low pressure sensor has been proposed to be used in the eye for glaucoma treatment with pressure ranging from 10 mmHg to 75 mmHg. This paper presents process development of thin layer membrane for very low pressure sensor application. The structure of the membrane consists of parallel plate which both top and bottom electrodes were fixed at both sides. Utilizing CMOS compatible process, fabrication of the thin layer membrane involved in three stages; i) hole opening etch, ii) sacrificial intermediate oxide release etch and iii) closing of etch holes. Our work focuses on the characterization of holes opening etch size for the intermediate oxide release. Another study was carried out to understand the behavior of sealing off the hole openings etch. This study involved different deposition technique such as LPCVD, PECVD and combination both of them. The findings from these experiments are presented in this paper.
  • Keywords
    CMOS integrated circuits; biomedical equipment; biomedical measurement; diseases; etching; eye; laser deposition; membranes; patient treatment; plasma CVD; pressure sensors; CMOS compatible process; LPCVD deposition technique; PECVD; electrodes; eye; glaucoma treatment; hole opening etch; parallel plate; pressure 10 mm Hg to 75 mm Hg; sacrificial intermediate oxide release etch; thin layer membrane fabrication; very low pressure sensor application; Biomembranes; CMOS process; Capacitive sensors; Electrodes; Etching; Fabrication; Humans; Intracranial pressure sensors; Micromachining; Optical sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4244-3873-0
  • Electronic_ISBN
    978-1-4244-2561-7
  • Type

    conf

  • DOI
    10.1109/SMELEC.2008.4770342
  • Filename
    4770342